Near-Field Scanning and Propagation of Correlated Low-Frequency Radiated Emissions
نویسندگان
چکیده
منابع مشابه
Fully Time-domain Scanning of EM Near-Field Radiated by RF Circuits
Abstract—This paper deals with planar scanning technique of electromagnetic (EM) near-field (NF) emitted by electronic printed circuit boards (PCBs) fully in the time-domain (TD). The proposed EM scanning metrology is essentially based on the NF test bench available at the IRSEEM laboratory. It comprises motorized mechanical structures for moving the probe interconnected to electronic measureme...
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Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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ژورنال
عنوان ژورنال: IEEE Transactions on Electromagnetic Compatibility
سال: 2018
ISSN: 0018-9375,1558-187X
DOI: 10.1109/temc.2017.2778046